March 25, 2021

Recommended event

09:00-09:15    OPENING
09:15-10:20    New forms of Digital Metrology for the new intelligent Industry – Toni Ventura | Datapixel (Spain)

10:20-10:55    Development of innovative smart 4.0 tooling set for the manufacturing and assembly of the Advanced Rear end product
Gorka Kortaberria | Tekniker (Spain)

10:55-11:10    BREAK
11:10-11:45    Advanced Metrology for machine tool measurement
Ainhoa Etxabarri | Innovalia Metrology (Spain)

11:45-12:20    The experience of using material standards and interference systems for checking and calibrating coordinate measuring machines (CMM) of various measurement ranges
Valery Lysenko | VNIIMS (Russia)

12:20-12:55    Big Data-Driven Zero Defect Factory for Spindle Manufacturing
Roberto Pérez | GF (Switzerland)

12:55-13:10    Metrolab: Innovalia Metrology

13:10-15:10    BREAK
15:10-15:45    Extending the measurement capabilities of 3D X-ray microscopes to dimensional metrology

Herminso Villarraga-Gómez | Zeiss (USA)

15:45-16:20    QIF as an ISO standard for the automated Industry
Jennifer Herron | DMSC (USA)

16:20-16:30    Metrolab: Visualisation and interpretation of GD&T analyses (Volume Graphics)

16:30-17:05   5GROWTH: 5G Metrology for a 5G Industry
Oscar Lázaro | Innovalia Association (Spain)

17:05-17:30   Round table

17:30-17:45    CLOSING

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