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METROMEET 2022 – Metrology 4.0 A Key Enabler Of Industrial Decision Intelligence
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AGENDA
| 09:15-90:30 | Opening |
|---|---|
| 09:30-11:00 | Part 1 o Keynote - New Framework for Industrial Metrology driving Decision Intelligence (Toni Ventura - Datapixel, Spain) o Vision integrated system for a robot self-calibration solution through 6 DOF uncertainty assessment (Ahmed Chekh - Tekniker & Pablo Puerto - Ideko, Spain) |
| 11:00-11:10 | Break |
| 11:10-13:10 | Part 2 o How to improve the accuracy of laser-based systems using straight lines (Ivan De Boi - University Antwerp, Belgium) o Industrial presentation (TBC) o Virtual uncertainty determination and error analysis for CMM laser (Michiel Vlaeyen - KU Leuven, Belgium) o Metrolab: Innovalia Metrology |
| 13:10-14:20 | Break |
| 14:20-14:30 | Reconnect |
| 14:30-17:15 | Part 3 o 5 Axis Machine Tool Metrology for ZDM (Ainhoa Etxabarri - Innovalia Metrology, Spain) o Deep learning workflows for Improving scan time and image quality in 3D X-ray microscopy (Herminso Villarraga-Gómez - Carl Zeiss Industrial Metrology, USA) o Metrolab: Gerd Schwaderer - VOLUME GRAPHICS o Advanced Quality Planning with ISO QIF (Daniel Campbell - Capvidia, USA) o Development of an optimised close-range photogrammetry measurement system for coordinate metrology (Joe Eastwood - University of Nottingham, UK) o Presenting your results to a non-technical audience (Metrology Tip: Jay Elepano - ZEISS IQS, Germany) |
| 17:15-17:30 | Closing |