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METROMEET 2022 – Metrology 4.0 A Key Enabler Of Industrial Decision Intelligence

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7th of April



09:15-90:30 Opening
09:30-11:00 Part 1

o Keynote - New Framework for Industrial Metrology driving Decision Intelligence (Toni Ventura - Datapixel, Spain)

o Vision integrated system for a robot self-calibration solution through 6 DOF uncertainty assessment (Ahmed Chekh - Tekniker & Pablo Puerto - Ideko, Spain)
11:00-11:10 Break
11:10-13:10 Part 2

o How to improve the accuracy of laser-based systems using straight lines (Ivan De Boi - University Antwerp, Belgium)

o Industrial presentation (TBC)

o Virtual uncertainty determination and error analysis for CMM laser (Michiel Vlaeyen - KU Leuven, Belgium)

o Metrolab: Innovalia Metrology
13:10-14:20 Break
14:20-14:30 Reconnect
14:30-17:15 Part 3

o 5 Axis Machine Tool Metrology for ZDM (Ainhoa Etxabarri - Innovalia Metrology, Spain)

o Deep learning workflows for Improving scan time and image quality in 3D X-ray microscopy (Herminso Villarraga-Gómez - Carl Zeiss Industrial Metrology, USA)

o Metrolab: Gerd Schwaderer - VOLUME GRAPHICS

o Advanced Quality Planning with ISO QIF (Daniel Campbell - Capvidia, USA)

o Development of an optimised close-range photogrammetry measurement system for coordinate metrology (Joe Eastwood - University of Nottingham, UK)

o Presenting your results to a non-technical audience (Metrology Tip: Jay Elepano - ZEISS IQS, Germany)
17:15-17:30 Closing

Date And Time

2022-04-07 | 09:15 to
2022-05-26 | 17:30


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